P Math 161.7mm Wafer Solar Monocrystalline

Dull twf

CZ

Crystallinity

Monocrystalline

Technegau Ysgythriad Ffafriol（ASTM F47-88）

Math dargludedd

Math-P

Napson EC-80TPN

P/N

Dopant

Boron, Gallium

-

Crynodiad ocsigen [Oi]

≦8E+17 ar / cm³

FTIR (ASTM F121-83)

Crynodiad carbon [Cs]

≦5E+16 ar / cm³

FTIR (ASTM F123-91)

Dwysedd pwll ysgythriad (dwysedd dadleoli)

≦500 cm^-3

Technegau Ysgythriad Ffafriol（ASTM F47-88）

Cyfeiriadedd wyneb

& lt; 100> ± 3 °

Dull Diffreithiant Pelydr-X (ASTM F26-1987)

Cyfeiriadedd ochrau ffug-sgwâr

& lt; 010> ;,< 001=""> ± 3 °

Dull Diffreithiant Pelydr-X (ASTM F26-1987)

Gwrthiant

0.5-1.5 Ωcm

System archwilio wafer

MCLT (oes cludwr lleiafrifol)

≧50 μs

Sinton BCT-400

(gyda lefel pigiad: 1E15 cm^-3)

Geometreg

Sgwâr lled

Wafer Ochr ochr

161.7 ± 0.25 mm

system archwilio wafer

Diamedr Wafer

φ221 ± 0.25 mm

system archwilio wafer

Ongl rhwng yr ochrau cyfagos

90° ± 0.2°

system archwilio wafer

Trwch

180﹢20/﹣10 µm;

170﹢20/﹣10 µm

TTV (Cyfanswm amrywiad trwch)

≤27 µm

system archwilio wafer

Dull torri

DW

--

Ansawdd arwyneb

fel wedi'i dorri a'i lanhau, ni chaniateir halogiad gweladwy, (olew na saim, printiau bysedd, staeniau sebon, staeniau slyri, staeniau epocsi / glud)

system archwilio wafer

Saw marciau / grisiau

≤ 15µm

system archwilio wafer

Bow

≤ 40 µm

system archwilio wafer

Warp

≤ 40 µm

system archwilio wafer

Sglodion

dyfnder ≤0.3mm a hyd ≤ 0.5mm Max 2 / pcs; dim sglodyn V.

System archwilio llygaid noeth neu wafer

Micro-graciau / tyllau

Ni chaniateir

system archwilio wafer